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Microscope

JX-SZM
With an excellent optical system, the field of view is wider and clearer, and high-quality and bright imaging can be maintained at any magnification.
Suitable for assembly and inspection of PCB, LCD, and IC.


Observation head

45° tilted binocular observation head,
interpupillary distance adjustment: 54mm-76mm, fixed eyepiece

45° tilted trinocular observation head,
interpupillary distance adjustment: 54mm-76mm, fixed eyepiece

60° tilted binocular observation head,
interpupillary distance adjustment: 54mm-76mm, fixed eyepiece

 

Eyepiece

High eye point, large field of view eyepiece WF10X/22mm,
adjustable diopter, can be equipped with micrometer

High eye point, large field of view eyepiece WF15X/16mm,
adjustable diopter, can be equipped with micrometer

High eye point, large field of view eyepiece WF20X/12mm,
adjustable diopter, with micrometer

 

Objective

0.67X-4.5X continuous zoom objective lens, working distance 100mm

0.8X-5X continuous zoom objective lens, working distance 100mm

1X-6.7X continuously variable objective lens, working distance 100mm

Auxiliary objective

0.3X/287mm0.4X/217mm0.5X/187mm0.7X/120mm1.5X/47mm2X/26mm

Frame

One-piece vertical arm type with frame

Split column type, can be matched with any frame

Base

Flat Base

With light source base

Photographic equipment

0.35X/0.5X/0.65X/1X video adapter, C-type interface, adjustable focus

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